no code implementations • 31 Jan 2024 • YanRong Li, Juan Du, Fugee Tsung, Wei Jiang
This paper proposes a novel process control and monitoring method for the complex structure of high-dimensional image-based overlay errors (modeled in tensor form), which are collected in semiconductor manufacturing processes.
no code implementations • 17 Sep 2023 • YanRong Li, Juan Du, Wei Jiang
Design of process control scheme is critical for quality assurance to reduce variations in manufacturing systems.
no code implementations • 22 Oct 2021 • YanRong Li, Juan Du, Wei Jiang
Process control is widely discussed in the manufacturing process, especially for semiconductor manufacturing.
no code implementations • 22 Oct 2021 • YanRong Li, Lai Wei, Wei Jiang
This paper proposes a two-stage pricing strategy for nondurable (such as typical electronics) products, where retail price is cut down at certain time points of the product lifecycle.