Search Results for author: Tae Yeob Kang

Found 2 papers, 0 papers with code

In situ Fault Diagnosis of Indium Tin Oxide Electrodes by Processing S-Parameter Patterns

no code implementations16 Aug 2023 Tae Yeob Kang, Haebom Lee, Sungho Suh

In the field of optoelectronics, indium tin oxide (ITO) electrodes play a crucial role in various applications, such as displays, sensors, and solar cells.

Dimensionality Reduction Fault Detection

Learning Graph Patterns of Reflection Coefficient for Non-destructive Diagnosis of Cu Interconnects

no code implementations20 Apr 2023 Tae Yeob Kang, Haebom Lee, Sungho Suh

Fault detection and diagnosis of the interconnects are crucial for prognostics and health management (PHM) of electronics.

Ensemble Learning Fault Detection +2

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