Search Results for author: Simon Demey

Found 1 papers, 0 papers with code

Joint data rate and EMF exposure analysis in Manhattan environments: stochastic geometry and ray tracing approaches

no code implementations26 Jan 2023 Charles Wiame, Simon Demey, Luc Vandendorpe, Philippe De Doncker, Claude Oestges

Using this framework, a number of performance metrics are derived: first moments, marginal distributions and joint distributions of the data rate and exposure.

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