no code implementations • 22 Jan 2024 • Jeremy J. Axelrod, Jessie T. Zhang, Petar N. Petrov, Robert M. Glaeser, Holger Mueller
Although defocus can be used to generate partial phase contrast in transmission electron microscope images, cryo-electron microscopy (cryo-EM) can be further improved by the development of phase plates which increase contrast by applying a phase shift to the unscattered part of the electron beam.
