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Improving Fabrication Fidelity of Integrated Nanophotonic Devices Using Deep Learning
Without modifying the nanofabrication process, adding significant computation in design, or requiring proprietary process specifications, we believe our model opens the door to new levels of reliability and performance in next-generation photonic circuits.
PCA-Boosted Autoencoders for Nonlinear Dimensionality Reduction in Low Data Regimes
We show that our proposed approach is substantially better than both PCA and randomly initialized AE in the majority of low-data regime cases we consider, or at least is comparable to the best of either of the other two methods.
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