3 code implementations • 20 Nov 2018 • Felipe Oviedo, Zekun Ren, Shijing Sun, Charlie Settens, Zhe Liu, Noor Titan Putri Hartono, Ramasamy Savitha, Brian L. DeCost, Siyu I. P. Tian, Giuseppe Romano, Aaron Gilad Kusne, Tonio Buonassisi
X-ray diffraction (XRD) data acquisition and analysis is among the most time-consuming steps in the development cycle of novel thin-film materials.