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Predicting Power Electronics Device Reliability under Extreme Conditions with Machine Learning Algorithms
Power device reliability is a major concern during operation under extreme environments, as doing so reduces the operational lifetime of any power system or sensing infrastructure.
SOS: Online probability estimation and generation of T and B cell receptors
Recent advances in modelling VDJ recombination and subsequent selection of T and B cell receptors provide useful tools to analyze and compare immune repertoires across time, individuals, and tissues.
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